45° Multi Holder for 6 Pin Stubs Automated AFM for CD Mode forensics and delicate wafer handling

forensics and delicate wafer handling

Feedback loop enables precise and consistent coating thickness

constrained to the distal end of the cantilever

2µm Diameter Holes - 1

Microcell for Innova and CP-II

45° Multi Holder for 6 Pin Stubs Automated AFM for CD Mode forensics and delicate wafer handlingDESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3. 2mm (1 8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain