PELCO® Multiple FIB Grid Holder 40 kHz Lapped surface on one side

Lapped surface on one side for smoothness

Needle tips length is 39mm (1

Tip Geometry: Standard Tip Height: 10 - 15 Front Angle: 25+/-2 Back Angle: 15+/-2 Side Angle: 17

I - 16047 SDS (114KB PDF)

9 Cantilever Geometry: Rectangular Cantilevers Number: 1 Back Side Coating: TiW/Au (500)

PELCO® Multiple FIB Grid Holder 40 kHz Lapped surface on one sideDESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3. 2mm (1 8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain